R. P. A., R. S. M., N. S., N. C., and S. J., “Design and Implementation of a SEC-DED-DAEC-STEC Error Control Code for Reliable Memory System”, J. Electron. Inform., vol. 8, no. 3, pp. 217–234, Jun. 2026, doi: 10.36548/jei.2026.3.002.