Journal of Electronics and Informatics
IRO Journals
Volume 7 — Issue 2 — June 2025

Enhanced Fault Detection for FPGA-based Elliptic Curve Cryptography

https://doi.org/10.36548/jei.2025.2.005
Kiruthika G.
Department of Electronics and Communication Engineering, Periyar Maniammai Institute of Science and Technology, Thanjavur
Udhaya M.
Department of Electronics and Communication Engineering, Periyar Maniammai Institute of Science and Technology, Thanjavur
Swetha A.
Department of Electronics and Communication Engineering, Periyar Maniammai Institute of Science and Technology, Thanjavur
Priyanka B.
Department of Electronics and Communication Engineering, Periyar Maniammai Institute of Science and Technology, Thanjavur
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How to Cite

G., Kiruthika, Udhaya M., Swetha A., and Priyanka B. 2025. “Enhanced Fault Detection for FPGA-Based Elliptic Curve Cryptography”. Journal of Electronics and Informatics 7 (2): 133-42. https://doi.org/10.36548/jei.2025.2.005.
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Keywords

— Elliptic Curve Scalar Multiplication (ECSM)
— Elliptic Curve cryptography (ECC)
— Communication Window method
— FPGA
— Error detection
Published: 13-06-2025

Abstract

For secure communications in particular, elliptic curve cryptography relies heavily on Elliptic Curve Scalar Multiplication (ECSM). The window approach is perfect for FPGA-based solutions since it increases ECSM efficiency. Verifying the accuracy of calculations made by hardware or software is essential to spotting possible mistakes. In this study, we introduce new defect detection strategies for scalar multiplication using the window method, which has not been studied in detail. Our strategy entails creating intricate algorithms and implementations to successfully minimize both transient and permanent faults. We validate our method's correctness by simulating a failure model, proving its dependability and broad error coverage in our assessments.

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