R., Anjali; R., Sorna Marium; M., Sujithra; K., Mariammal. Fault-Resilient Brent-Kung Adder Design Using Advanced Built-in Self-Test (BIST) Architecture. Journal of Electronics and Informatics, [S. l.], v. 7, n. 1, p. 1–18, 2025. DOI: 10.36548/jei.2025.1.001. Disponível em: https://irojournals.com/iroei/article/view/570. Acesso em: 21 mar. 2026.